Establishing nonlinearity thresholds with ultraintense X-ray pulses

نویسندگان

  • Jakub Szlachetko
  • Joanna Hoszowska
  • Jean-Claude Dousse
  • Maarten Nachtegaal
  • Wojciech Błachucki
  • Yves Kayser
  • Jacinto Sà
  • Marc Messerschmidt
  • Sebastien Boutet
  • Garth J. Williams
  • Christian David
  • Grigory Smolentsev
  • Jeroen A. van Bokhoven
  • Bruce D. Patterson
  • Thomas J. Penfold
  • Gregor Knopp
  • Marek Pajek
  • Rafael Abela
  • Christopher J. Milne
چکیده

X-ray techniques have evolved over decades to become highly refined tools for a broad range of investigations. Importantly, these approaches rely on X-ray measurements that depend linearly on the number of incident X-ray photons. The advent of X-ray free electron lasers (XFELs) is opening the ability to reach extremely high photon numbers within ultrashort X-ray pulse durations and is leading to a paradigm shift in our ability to explore nonlinear X-ray signals. However, the enormous increase in X-ray peak power is a double-edged sword with new and exciting methods being developed but at the same time well-established techniques proving unreliable. Consequently, accurate knowledge about the threshold for nonlinear X-ray signals is essential. Herein we report an X-ray spectroscopic study that reveals important details on the thresholds for nonlinear X-ray interactions. By varying both the incident X-ray intensity and photon energy, we establish the regimes at which the simplest nonlinear process, two-photon X-ray absorption (TPA), can be observed. From these measurements we can extract the probability of this process as a function of photon energy and confirm both the nature and sub-femtosecond lifetime of the virtual intermediate electronic state.

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عنوان ژورنال:

دوره 6  شماره 

صفحات  -

تاریخ انتشار 2016